Evaluation of Using Kelvin Contacts for Integrated Circuit Decoupling

Nikolaus JUCH, Bernd DEUTSCHMANN, Gunter WINKLER, TU Graz/Institut für Elektronik

Abstract

There is evidence that the use of so-called Kelvin contacts for connecting a decoupling capacitor to an integrated circuit (IC) can have a significant impact on the electromagnetic emission behavior. In this poster we will present the basic principle of Kelvin contacts for IC decoupling. Based on a test IC several measurement results together with a scientific explanation will be presented to evaluate the impact of such Kelvin contacts on the conducted electromagnetic emission.