Evaluation of Using Kelvin Contacts for Integrated Circuit Decoupling
![(c) Deutschmann Bernd (c) Deutschmann Bernd](/fileadmin/uploads/_processed_/7/3/csm_deutschmann-bernd-120x150px_fcecf42916.png)
Nikolaus JUCH, Bernd DEUTSCHMANN, Gunter WINKLER, TU Graz/Institut für Elektronik
Abstract
There is evidence that the use of so-called Kelvin contacts for connecting a decoupling capacitor to an integrated circuit (IC) can have a significant impact on the electromagnetic emission behavior. In this poster we will present the basic principle of Kelvin contacts for IC decoupling. Based on a test IC several measurement results together with a scientific explanation will be presented to evaluate the impact of such Kelvin contacts on the conducted electromagnetic emission.