ELDRS - Low Dose Rate Testing
Michael Wind, Marcin Latocha, Peter Beck
Seibersdorf Laboratories, Seibersdorf, Austria
Abstract
The ELDRS effect (Enhanced Low Dose Rate Sensitivity) can cause functional failure of electronic devices that are operated in a low dose rate radiation environment (e.g. satellites) and thus might be a limiting factor for the applicability of ELDRS susceptible devices. Testing at low dose rates using high dose levels for the TID (Total Ionizing Dose) exposures requires long test times which is associated with high costs.
Seibersdorf Laboratories has experience in characterizing electronic devices with respect to ELDRS. Within the scope of a comprehensive study an accelerated ELDRS test method [1, 2] was investigated. The device selection for this study comprised five operational amplifiers, three comparators and a reference diode manufactured by various companies.
The design of the TEC-Laboratory allows the exposure of test samples within a wide dose rate range that covers both of the two dose rate windows as specified in the ESCC basic specifications by ESA [3]. Within the TEC-Laboratory it is possible to expose a significant amount of various electronic parts at the same time at a low dose rate for an extensive period of time on the one hand side, but also at standard dose rate on the other hand. Thus the TEC-Laboratory is perfectly suited also for ELDRS testing, particularly when considering technical and economical aspects.
References
[1] J. Boch, F. Saigné, R.D. Schrimpf, J.-R. Vaillé, L. Dusseau, S. Ducret, M. Bernard, E. Lorfèvre, and C. Chatry,
Estimation of Low-Dose-Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiements,
IEEE-TNS, vol. 52 (6), p. 2616, December 2005
[2] Wind, M., Beck, P.; Boch, J.; Dusseau, L.; Latocha, M.; Poizat, M.; Zadeh, A., Applicability of the Accelerated
Switching Test Method - A Comprehensive Survey, Radiation Effects Data Workshop (REDW), 2011. eldrs.net
[3] ESCC Basic Specification No. 22900, Total Dose Steady-State Irradiation Test Method, Issue 4,ESA, 2010
Acknowledgements
The authors gratefully acknowledge the support by the European Space Agency (ESA) and the Austrian Promotion Agency, FFG.