Testing of Commercial Components of the Shelf
Michael Wind, Marcin Latocha, Peter Beck
Seibersdorf Laboratories, Seibersdorf, Austria
Abstract
Seibersdorf Laboratories contributed to ESA’s European Component Initiative (ECI) [1]. The goal of this activity was to increase experimental radiation data available for commercial of the shelf (COTS) parts of European manufacturers. Looking explicitly at European products seems to be of severe importance since the majority of semiconductor manufacturers that are performing radiation hardness testing are located in the United States of America. Thus activities such as ECI are enhancing the European industrial base for critical technologies needed by Europe’s space missions and reduce the dependence of Europe’s space sector on non-European component suppliers.
Within the scope of this activity comparators, operational amplifier and power MOSFETs manufactured by Austriamicrosystems AG, STMicroelectronics and Infineon have been characterized with respect to their TID tolerance. The total ionising dose (TID) testing was performed in the radiation standard laboratory at Seibersdorf [2] according to ECSS Specification No. 22900 [3]. The power devices have also been investigated with respect to their tolerance against single event gate rupture (SEGR). Single event effect (SEE) testing was carried out at the heavy ion exposure facility of University of Jyväskylä (RADEF) [4]. SEGR tests were performed according to MIL-STD-750-1 test method 1080 [5].
The results indicate the potential applicability of the tested COTS parts for low dose space missions having a TID dose level less than 20 krad.
References
[1] ESA, http://www.esa.int/Our_Activities/Space_Engineering_Technology/European_Component_Initiative_ECI, 2015
[2] A. Baumgartner, C. Hranitzky, H. Stadtmann, F.J. Maringer: Determination of Photon Fluence Spectra form a Co-60 Therapy Unit based on PENELOPE and MCNP Simulations, Radiat. Meas., vol. 46, pp. 595 – 601, 2011
[3] ESCC Basic Specification No. 22900, Total Dose Steady-State Irradiation Test Method, Issue 4, ESA, 2010
[4] University of Jyväskylä, https://www.jyu.fi/fysiikka/en/research/accelerator/radef, 2015
[5] MIL-STD-750-1: Test Method Standard; Environmental Test Methods for Semiconductor Devices, Part1; Department of Defense, 2012