Abstract

Fundamentals of Laser Testing for Single-Event Effects

Vincent POUGET ^1
1 Institute of Electronics and Systems, CNRS, University of Montpellier, France

 

Abstract

The laser method for Single-Event Effects testing is based on the photoelectric interaction of a short and focused laser pulse with the semiconductor material of a device to mimic the transient and localized track of electron-hole pairs that is produced by primary or secondary ionizing particles from radiation environments. This talk introduces the fundamentals of the laser testing technique and review important experimental parameters and practical considerations, providing the required knowledge to understand the capabilities and limitations of the technique and to prepare a laser testing campaign. Typical use cases are illustrated and the question of correlation is briefly discussed.

 

References

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