Abstract
With the “New Space” approach, space is envisioned to become accessible and affordable to all with the development of low-cost satellite systems. A large part of this dream revolves around using commercially available high-performance electronic components and systems. However, a key barrier to the widespread usage of COTS parts in space is the harsh natural radiation environment.
In this short course, an overview of the single-event effects impacting advanced semiconductor nodes will be discussed. Key metrics for designing SEE tests, such as sample preparation, biasing conditions, thermal impacts, internal fault tolerance mechanisms, etc. will be covered. Being able to determine the interplay of these variables is an integral part of designing a test to meet the needs of a specific mission.
The short course will also explore designing test fixtures, selection of test facilities, executing tests, and analyzing test data. Efficacies and limitations of board-level SEE testing, as opposed to component-level SEE testing, for evaluating the vulnerability of COTS components for application in space, will also be discussed.
Contents
- Introduction: Traditional space vs. "New Space"
- Single-Event Effects
- Basic Mechanisms: Charge Deposition and Collection
- Destructive and non-destructive events
- Impact of technology scaling
- SEE Testing of Complex Components
- Sample preparation
- Typical test campaign
- Common pitfalls and limitations
- Mature applications and methods
- System-level SEE Testing as an alternative
Short CV
Indranil Chatterjee (M’14, SM’19) received his M.S. and Ph.D. degrees in Electrical Engineering from Vanderbilt University, USA in 2014. Afterwards, he worked as a Postdoctoral Scientist in GaN power device development and reliability with the Centre for Device Thermography and Reliability at the University of Bristol, UK. In 2016, he joined Airbus Defence and Space in Germany as a Semiconductor Radiation Effects and Reliability Engineer where he is involved in R&D, design, radiation and reliability analysis of critical electronic systems for earth-observation, navigation and telecommunication satellites, and interplanetary probes.
His research interests include Radiation Tolerance of Semiconductor Devices, Semiconductor Device Physics, Reliability, and Novel Devices. Indranil has authored and co-authored more than 50 publications and articles in premiere international journals and conferences and has delivered keynotes, and invited talks in US, Asia, and Europe. He is a Senior Member of IEEE, serves as a reviewer for several IEEE journals and conferences, and has chaired technical program sessions at NSREC and IRPS.